Quality Products for the Global Test Industry

Rika Denshi America has been a leader in test probe (spring probe) development, design and manufacture for over 50 years. We offer high quality test probes and interconnect designs that will surpass most test requirements, including semiconductor test probes, battery contact, tester interface, burn-in test probes and kelvin test probes.

Pin of the Month

RI-050-02 Series - 0.0315” [0.8] Pitch
0.0236” [0.6mm] Diameter testprobe with a .085" [2.15] test length. <40mOhms contact resistance.with 0197" [0.5] plunger travel with 28 grams of spring force.

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Service Beyond Customer Expectations

Rika Denshi America’s service oriented sales engineers and support staff will direct our customers in selection of the proper test probe (spring probe) for the customer’s test application. With our worldwide network of facilities and support staffs, we have test probes (spring probes) that will meet the majority of our customers’ needs. If our customers’ test application requires a custom test probe or test probe interface assembly, Rika Denshi America’s engineering and manufacturing groups can design, develop and manufacture a test probe, tester interface or test assembly that will exceed their mechanical specifications, quality requirements and delivery demands.

Rika Denshi America strives to go beyond our customer specifications and expectations. Please contact our Sales Staff, for assistance, with any of your test probe and test requirements.

Upcoming Events

  • 2014 BiTS Workshop

    Phoenix, AZ

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  • SWTW 2013

    San Diego

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